Pseudo-random testing and signature analysis for mixed-signal circuits

Chen-Yang Pan, Kwang-Ting Cheng. Pseudo-random testing and signature analysis for mixed-signal circuits. In Richard L. Rudell, editor, Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995, San Jose, California, USA, November 5-9, 1995. pages 102-107, IEEE Computer Society, 1995. [doi]

@inproceedings{PanC95,
  title = {Pseudo-random testing and signature analysis for mixed-signal circuits},
  author = {Chen-Yang Pan and Kwang-Ting Cheng},
  year = {1995},
  doi = {10.1145/224841.224867},
  url = {http://doi.acm.org/10.1145/224841.224867},
  tags = {testing, analysis, random testing},
  researchr = {https://researchr.org/publication/PanC95},
  cites = {0},
  citedby = {0},
  pages = {102-107},
  booktitle = {Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995, San Jose, California, USA, November 5-9, 1995},
  editor = {Richard L. Rudell},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-7213-7},
}