System-level optimization and benchmarking for InAs nanowire based gate-all-around tunneling FETs

Chenyun Pan, Ahmet Ceyhan, Azad Naeemi. System-level optimization and benchmarking for InAs nanowire based gate-all-around tunneling FETs. In International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013. pages 196-202, IEEE, 2013. [doi]

@inproceedings{PanCN13,
  title = {System-level optimization and benchmarking for InAs nanowire based gate-all-around tunneling FETs},
  author = {Chenyun Pan and Ahmet Ceyhan and Azad Naeemi},
  year = {2013},
  doi = {10.1109/ISQED.2013.6523610},
  url = {http://dx.doi.org/10.1109/ISQED.2013.6523610},
  researchr = {https://researchr.org/publication/PanCN13},
  cites = {0},
  citedby = {0},
  pages = {196-202},
  booktitle = {International Symposium on Quality Electronic Design, ISQED 2013, Santa Clara, CA, USA, March 4-6, 2013},
  publisher = {IEEE},
  isbn = {978-1-4673-4951-2},
}