Exploiting Memory Device Wear-Out Dynamics to Improve NAND Flash Memory System Performance

Yangyang Pan, Guiqiang Dong, Tong Zhang. Exploiting Memory Device Wear-Out Dynamics to Improve NAND Flash Memory System Performance. In Gregory R. Ganger, John Wilkes, editors, 9th USENIX Conference on File and Storage Technologies, San Jose, CA, USA, February 15-17, 2011. pages 245-258, USENIX, 2011. [doi]

Abstract

Abstract is missing.