A comprehensive metering scheme for intellectual property protection during both after-sale and evaluation periods of IC design - researchr publication authors

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Aobo Pan, Yaping Lin, Wenjie Che, Zhiqiang You, Yonghe Liu, Jinguo Li. A comprehensive metering scheme for intellectual property protection during both after-sale and evaluation periods of IC design. IEICE Electronic Express, 10(19):20130649, 2013. [doi]

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