Fei Pan, Xiaofan Li, Haibo Pu, Yan Guo, Jiangchuan Liu. Physical Layer Authentication Based on Residual Network for Industrial Wireless CPSs. In The 46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020, Singapore, October 18-21, 2020. pages 4368-4373, IEEE, 2020. [doi]
Abstract is missing.