Constrained Total Variation Based Three-Dimension Single Particle Reconstruction in Cryogenic Electron Microscopy

Huan Pan, You-Wei Wen, Tieyong Zeng. Constrained Total Variation Based Three-Dimension Single Particle Reconstruction in Cryogenic Electron Microscopy. J. Sci. Comput., 85(2):37, 2020. [doi]

Authors

Huan Pan

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You-Wei Wen

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Tieyong Zeng

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