Huan Pan, You-Wei Wen, Tieyong Zeng. Constrained Total Variation Based Three-Dimension Single Particle Reconstruction in Cryogenic Electron Microscopy. J. Sci. Comput., 85(2):37, 2020. [doi]
@article{PanWZ20-1,
title = {Constrained Total Variation Based Three-Dimension Single Particle Reconstruction in Cryogenic Electron Microscopy},
author = {Huan Pan and You-Wei Wen and Tieyong Zeng},
year = {2020},
doi = {10.1007/s10915-020-01344-4},
url = {https://doi.org/10.1007/s10915-020-01344-4},
researchr = {https://researchr.org/publication/PanWZ20-1},
cites = {0},
citedby = {0},
journal = {J. Sci. Comput.},
volume = {85},
number = {2},
pages = {37},
}