A. V. Panchenko, N. V. Reshetnyak, A. M. Samohin, V. V. Postnikov. The automated testing facility based on machine vision for optimizing grain quality control technology. In Antanas Verikas, Petia Radeva, Dmitry P. Nikolaev, Wei Zhang, Jianhong Zhou, editors, Ninth International Conference on Machine Vision, ICMV 2016, Nice, France, 18-20 November 2016. Volume 10341 of SPIE Proceedings, SPIE, 2016. [doi]
@inproceedings{PanchenkoRSP16,
title = {The automated testing facility based on machine vision for optimizing grain quality control technology},
author = {A. V. Panchenko and N. V. Reshetnyak and A. M. Samohin and V. V. Postnikov},
year = {2016},
doi = {10.1117/12.2268596},
url = {https://doi.org/10.1117/12.2268596},
researchr = {https://researchr.org/publication/PanchenkoRSP16},
cites = {0},
citedby = {0},
booktitle = {Ninth International Conference on Machine Vision, ICMV 2016, Nice, France, 18-20 November 2016},
editor = {Antanas Verikas and Petia Radeva and Dmitry P. Nikolaev and Wei Zhang and Jianhong Zhou},
volume = {10341},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {9781510611313},
}