A. V. Panchenko, N. V. Reshetnyak, A. M. Samohin, V. V. Postnikov. The automated testing facility based on machine vision for optimizing grain quality control technology. In Antanas Verikas, Petia Radeva, Dmitry P. Nikolaev, Wei Zhang, Jianhong Zhou, editors, Ninth International Conference on Machine Vision, ICMV 2016, Nice, France, 18-20 November 2016. Volume 10341 of SPIE Proceedings, SPIE, 2016. [doi]
Abstract is missing.