Development of a methodology for bearing fault scrutiny and diagnosis using SVM

Shrinathan Esakimuthu Pandarakone, Keisuke Akahori, Toshiki Matsumura, Yukio Mizuno, Hisahide Nakamura. Development of a methodology for bearing fault scrutiny and diagnosis using SVM. In IEEE International Conference on Industrial Technology, ICIT 2017, Toronto, ON, Canada, March 22-25, 2017. pages 282-287, IEEE, 2017. [doi]

@inproceedings{PandarakoneAMMN17,
  title = {Development of a methodology for bearing fault scrutiny and diagnosis using SVM},
  author = {Shrinathan Esakimuthu Pandarakone and Keisuke Akahori and Toshiki Matsumura and Yukio Mizuno and Hisahide Nakamura},
  year = {2017},
  doi = {10.1109/ICIT.2017.7913097},
  url = {https://doi.org/10.1109/ICIT.2017.7913097},
  researchr = {https://researchr.org/publication/PandarakoneAMMN17},
  cites = {0},
  citedby = {0},
  pages = {282-287},
  booktitle = {IEEE International Conference on Industrial Technology, ICIT 2017, Toronto, ON, Canada, March 22-25, 2017},
  publisher = {IEEE},
  isbn = {978-1-5090-5320-9},
}