Performance investigation of Reconfigurable-FET under the influence of parameter variability of ferroelectric gate stack at high temperatures

Priyanka Pandey, Harsupreet Kaur. Performance investigation of Reconfigurable-FET under the influence of parameter variability of ferroelectric gate stack at high temperatures. Microelectronics Journal, 124:105442, 2022. [doi]

@article{PandeyK22-0,
  title = {Performance investigation of Reconfigurable-FET under the influence of parameter variability of ferroelectric gate stack at high temperatures},
  author = {Priyanka Pandey and Harsupreet Kaur},
  year = {2022},
  doi = {10.1016/j.mejo.2022.105442},
  url = {https://doi.org/10.1016/j.mejo.2022.105442},
  researchr = {https://researchr.org/publication/PandeyK22-0},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Journal},
  volume = {124},
  pages = {105442},
}