Amit Pandey, Brendan Tully, Abhijeet Samudra, Ajay Nagarandal, Karthikeyan Natarajan, Rahul Singhal. Novel Technique for Manufacturing & In-system Testing of Large Scale SoC using Functional Protocol Based High-Speed I/O. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1-7, IEEE, 2022. [doi]
@inproceedings{PandeyTSNNS22,
title = {Novel Technique for Manufacturing & In-system Testing of Large Scale SoC using Functional Protocol Based High-Speed I/O},
author = {Amit Pandey and Brendan Tully and Abhijeet Samudra and Ajay Nagarandal and Karthikeyan Natarajan and Rahul Singhal},
year = {2022},
doi = {10.1109/VTS52500.2021.9794234},
url = {https://doi.org/10.1109/VTS52500.2021.9794234},
researchr = {https://researchr.org/publication/PandeyTSNNS22},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022},
publisher = {IEEE},
isbn = {978-1-6654-1060-1},
}