D. Pandy, R. Sharma, Suresh Sharma. Simulation Comparison of Capacitance Voltage Characteristics in Nickel Oxide and Silicon dioxide-based MOS Capacitor. In 2022 International Conference on Cyber Resilience (ICCR), Dubai, United Arab Emirates, October 6-7, 2022. pages 1-5, IEEE, 2022. [doi]
Abstract is missing.