Liang-Teck Pang, Borivoje Nikolic. Measurements and Analysis of Process Variability in 90nmCMOS. J. Solid-State Circuits, 44(5):1655-1663, 2009. [doi]
@article{PangN09, title = {Measurements and Analysis of Process Variability in 90nmCMOS}, author = {Liang-Teck Pang and Borivoje Nikolic}, year = {2009}, doi = {10.1109/JSSC.2009.2015789}, url = {https://doi.org/10.1109/JSSC.2009.2015789}, researchr = {https://researchr.org/publication/PangN09}, cites = {0}, citedby = {0}, journal = {J. Solid-State Circuits}, volume = {44}, number = {5}, pages = {1655-1663}, }