Measurements and Analysis of Process Variability in 90nmCMOS

Liang-Teck Pang, Borivoje Nikolic. Measurements and Analysis of Process Variability in 90nmCMOS. J. Solid-State Circuits, 44(5):1655-1663, 2009. [doi]

@article{PangN09,
  title = {Measurements and Analysis of Process Variability in 90nmCMOS},
  author = {Liang-Teck Pang and Borivoje Nikolic},
  year = {2009},
  doi = {10.1109/JSSC.2009.2015789},
  url = {https://doi.org/10.1109/JSSC.2009.2015789},
  researchr = {https://researchr.org/publication/PangN09},
  cites = {0},
  citedby = {0},
  journal = {J. Solid-State Circuits},
  volume = {44},
  number = {5},
  pages = {1655-1663},
}