Simon Pankner, Dennis Gnad, Vincent Meyers, Mehdi B. Tahoori. Leaking at the Edge: EM Side-Channel Input Recovery on Edge TPU. In 27th International Symposium on Quality Electronic Design, ISQED 2026, San Francisco, CA, USA, April 8-10, 2026. pages 1-6, IEEE, 2026. [doi]
Abstract is missing.