P. Pant, M. Amodeo, S. Vora, J. Colburn. Innovative practices session 10C: Delay test. In 31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013. pages 1, IEEE Computer Society, 2013. [doi]
@inproceedings{PantAVC13,
title = {Innovative practices session 10C: Delay test},
author = {P. Pant and M. Amodeo and S. Vora and J. Colburn},
year = {2013},
doi = {10.1109/VTS.2013.6548938},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2013.6548938},
researchr = {https://researchr.org/publication/PantAVC13},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {31st IEEE VLSI Test Symposium, VTS 2013, Berkeley, CA, USA, April 29 - May 2, 2013},
publisher = {IEEE Computer Society},
isbn = {978-1-4673-5542-1},
}