Hardware hooks for transition scan characterization

Pankaj Pant, Eric Skeels. Hardware hooks for transition scan characterization. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-8, IEEE, 2011. [doi]

Authors

Pankaj Pant

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Eric Skeels

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