Impacts of random telegraph noise on the analog properties of FinFET and trigate devices and Widlar current source

Chia-Hao Pao, Ming-Long Fan, Ming-Fu Tsai, Yin-Nien Chen, Vita Pi-Ho Hu, Pin Su, Ching-Te Chuang. Impacts of random telegraph noise on the analog properties of FinFET and trigate devices and Widlar current source. In IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012. pages 1-4, IEEE, 2012. [doi]

@inproceedings{PaoFTCHSC12-0,
  title = {Impacts of random telegraph noise on the analog properties of FinFET and trigate devices and Widlar current source},
  author = {Chia-Hao Pao and Ming-Long Fan and Ming-Fu Tsai and Yin-Nien Chen and Vita Pi-Ho Hu and Pin Su and Ching-Te Chuang},
  year = {2012},
  doi = {10.1109/ICICDT.2012.6232841},
  url = {http://dx.doi.org/10.1109/ICICDT.2012.6232841},
  researchr = {https://researchr.org/publication/PaoFTCHSC12-0},
  cites = {0},
  citedby = {0},
  pages = {1-4},
  booktitle = {IEEE International Conference on IC Design & Technology, ICICDT 2012, Austin, TX, USA, May 30 - June 1, 2012},
  publisher = {IEEE},
  isbn = {978-1-4673-0146-6},
}