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Threats to the validity of mutation-based test assessment

Mike Papadakis, Christopher Henard, Mark Harman, Yue Jia, Yves Le Traon. Threats to the validity of mutation-based test assessment. In Andreas Zeller, Abhik Roychoudhury, editors, Proceedings of the 25th International Symposium on Software Testing and Analysis, ISSTA 2016, Saarbrücken, Germany, July 18-20, 2016. pages 354-365, ACM, 2016. [doi]

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Mike Papadakis

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Christopher Henard

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Mark Harman

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Yue Jia

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Yves Le Traon

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