Mike Papadakis, Christopher Henard, Mark Harman, Yue Jia, Yves Le Traon. Threats to the validity of mutation-based test assessment. In Andreas Zeller, Abhik Roychoudhury, editors, Proceedings of the 25th International Symposium on Software Testing and Analysis, ISSTA 2016, Saarbrücken, Germany, July 18-20, 2016. pages 354-365, ACM, 2016. [doi]
@inproceedings{PapadakisHHJT16,
title = {Threats to the validity of mutation-based test assessment},
author = {Mike Papadakis and Christopher Henard and Mark Harman and Yue Jia and Yves Le Traon},
year = {2016},
doi = {10.1145/2931037.2931040},
url = {http://doi.acm.org/10.1145/2931037.2931040},
researchr = {https://researchr.org/publication/PapadakisHHJT16},
cites = {0},
citedby = {0},
pages = {354-365},
booktitle = {Proceedings of the 25th International Symposium on Software Testing and Analysis, ISSTA 2016, Saarbrücken, Germany, July 18-20, 2016},
editor = {Andreas Zeller and Abhik Roychoudhury},
publisher = {ACM},
isbn = {978-1-4503-4390-9},
}