Automatic mutation based test data generation

Mike Papadakis, Nicos Malevris. Automatic mutation based test data generation. In Natalio Krasnogor, Pier Luca Lanzi, editors, 13th Annual Genetic and Evolutionary Computation Conference, GECCO 2011, Companion Material Proceedings, Dublin, Ireland, July 12-16, 2011. pages 247-248, ACM, 2011. [doi]

Abstract

Abstract is missing.