Mike Papadakis, Donghwan Shin, Shin Yoo, Doo-Hwan Bae. Are mutation scores correlated with real fault detection?: a large scale empirical study on the relationship between mutants and real faults. In Michel Chaudron, Ivica Crnkovic, Marsha Chechik, Mark Harman, editors, Proceedings of the 40th International Conference on Software Engineering, ICSE 2018, Gothenburg, Sweden, May 27 - June 03, 2018. pages 537-548, ACM, 2018. [doi]
Abstract is missing.