Mike Papadakis, Yves Le Traon. Using Mutants to Locate "Unknown" Faults. In Giuliano Antoniol, Antonia Bertolino, Yvan Labiche, editors, 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation, Montreal, QC, Canada, April 17-21, 2012. pages 691-700, IEEE, 2012. [doi]
Abstract is missing.