Mike Papadakis, Yves Le Traon. Mutation testing strategies using mutant classification. In Sung Y. Shin, José Carlos Maldonado, editors, Proceedings of the 28th Annual ACM Symposium on Applied Computing, SAC '13, Coimbra, Portugal, March 18-22, 2013. pages 1223-1229, ACM, 2013. [doi]
Abstract is missing.