Mike Papadakis, Yves Le Traon. Effective fault localization via mutation analysis: a selective mutation approach. In Yookun Cho, Sung Y. Shin, Sang-Wook Kim, Chih-Cheng Hung, Jiman Hong, editors, Symposium on Applied Computing, SAC 2014, Gyeongju, Republic of Korea - March 24 - 28, 2014. pages 1293-1300, ACM, 2014. [doi]
Abstract is missing.