Dimitrios K. Papakostas, V. C. Kosmidis, Alkiviades A. Hatzopoulos. Analog fault detectability based on statistical circuit analysis. In Proceedings of Third International Conference on Electronics, Circuits, and Systems, ICECS 1996, Rodos, Greece, October 13-16, 1996. pages 1076-1079, IEEE, 1996. [doi]
Abstract is missing.