Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers

Christos Papameletis, Brion L. Keller, Vivek Chickermane, Erik Jan Marinissen, Said Hamdioui. Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

Abstract

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