George Papandreou, Iasonas Kokkinos, Pierre-André Savalle. Modeling local and global deformations in Deep Learning: Epitomic convolution, Multiple Instance Learning, and sliding window detection. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015, Boston, MA, USA, June 7-12, 2015. pages 390-399, IEEE, 2015. [doi]
@inproceedings{PapandreouKS15,
title = {Modeling local and global deformations in Deep Learning: Epitomic convolution, Multiple Instance Learning, and sliding window detection},
author = {George Papandreou and Iasonas Kokkinos and Pierre-André Savalle},
year = {2015},
doi = {10.1109/CVPR.2015.7298636},
url = {http://dx.doi.org/10.1109/CVPR.2015.7298636},
researchr = {https://researchr.org/publication/PapandreouKS15},
cites = {0},
citedby = {0},
pages = {390-399},
booktitle = {IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015, Boston, MA, USA, June 7-12, 2015},
publisher = {IEEE},
isbn = {978-1-4673-6964-0},
}