Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization

Nikolaos Papandreou, Thomas P. Parnell, Haralampos Pozidis, Thomas Mittelholzer, Evangelos Eleftheriou, Charles Camp, Thomas Griffin, Gary A. Tressler, Andrew Walls. Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization. ACM Trans. Design Autom. Electr. Syst., 20(4):62, 2015. [doi]

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