Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization - researchr publication related

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Nikolaos Papandreou, Thomas P. Parnell, Haralampos Pozidis, Thomas Mittelholzer, Evangelos Eleftheriou, Charles Camp, Thomas Griffin, Gary A. Tressler, Andrew Walls. Enhancing the Reliability of MLC NAND Flash Memory Systems by Read Channel Optimization. ACM Trans. Design Autom. Electr. Syst., 20(4):62, 2015. [doi]

The following publications are possibly variants of this publication:

Using adaptive read voltage thresholds to enhance the reliability of MLC NAND flash memory systemsNikolaos Papandreou, Thomas P. Parnell, Haralampos Pozidis, Thomas Mittelholzer, Evangelos Eleftheriou, Charles Camp, Thomas Griffin, Gary Tressler, Andrew Walls. glvlsi 2014: 151-156 [doi]

Capacity of the MLC NAND Flash ChannelThomas P. Parnell, Celestine Dunner, Thomas Mittelholzer, Nikolaos Papandreou. jsac, 34(9):2354-2365, 2016. [doi]

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