Thrasyvoulos N. Pappas. The rough side of texture: texture analysis through the lens of HVEI. In Bernice E. Rogowitz, Thrasyvoulos N. Pappas, Huib de Ridder, editors, Human Vision and Electronic Imaging XVIII, Burlingame, California, USA, February 4-7, 2013. Volume 8651 of SPIE Proceedings, SPIE, 2013. [doi]
@inproceedings{Pappas13,
title = {The rough side of texture: texture analysis through the lens of HVEI},
author = {Thrasyvoulos N. Pappas},
year = {2013},
doi = {10.1117/12.2012991},
url = {http://dx.doi.org/10.1117/12.2012991},
researchr = {https://researchr.org/publication/Pappas13},
cites = {0},
citedby = {0},
booktitle = {Human Vision and Electronic Imaging XVIII, Burlingame, California, USA, February 4-7, 2013},
editor = {Bernice E. Rogowitz and Thrasyvoulos N. Pappas and Huib de Ridder},
volume = {8651},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {978-0-8194-9424-5},
}