Thrasyvoulos N. Pappas. The rough side of texture: texture analysis through the lens of HVEI. In Bernice E. Rogowitz, Thrasyvoulos N. Pappas, Huib de Ridder, editors, Human Vision and Electronic Imaging XVIII, Burlingame, California, USA, February 4-7, 2013. Volume 8651 of SPIE Proceedings, SPIE, 2013. [doi]
Abstract is missing.