Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Rubin A. Parekhji. Test Techniques and Trade-offs for Embedded Cores and Systems. In 13th International Conference on VLSI Design (VLSI Design 2000), 4-7 January 2000, Calcutta, India. pages 5, IEEE Computer Society, 2000.
Abstract is missing.