Rubin A. Parekhji. DFT for Low Cost SOC Test. In 14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India. pages 451, IEEE Computer Society, 2005. [doi]
@inproceedings{Parekhji05,
title = {DFT for Low Cost SOC Test},
author = {Rubin A. Parekhji},
year = {2005},
doi = {10.1109/ATS.2005.51},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.51},
tags = {testing},
researchr = {https://researchr.org/publication/Parekhji05},
cites = {0},
citedby = {0},
pages = {451},
booktitle = {14th Asian Test Symposium (ATS 2005), 18-21 December 2005, Calcutta, India},
publisher = {IEEE Computer Society},
isbn = {0-7695-2481-8},
}