Rubin A. Parekhji. Innovative Practices Track: New Methods for System Level Test of Image Projection and Radar VLSI Systems. In 40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022. pages 1, IEEE, 2022. [doi]
@inproceedings{Parekhji22, title = {Innovative Practices Track: New Methods for System Level Test of Image Projection and Radar VLSI Systems}, author = {Rubin A. Parekhji}, year = {2022}, doi = {10.1109/VTS52500.2021.9794263}, url = {https://doi.org/10.1109/VTS52500.2021.9794263}, researchr = {https://researchr.org/publication/Parekhji22}, cites = {0}, citedby = {0}, pages = {1}, booktitle = {40th IEEE VLSI Test Symposium, VTS 2022, San Diego, CA, USA, April 25-27, 2022}, publisher = {IEEE}, isbn = {978-1-6654-1060-1}, }