Determining Patch Saliency Using Low-Level Context

Devi Parikh, C. Lawrence Zitnick, Tsuhan Chen. Determining Patch Saliency Using Low-Level Context. In David A. Forsyth, Philip H. S. Torr, Andrew Zisserman, editors, Computer Vision - ECCV 2008, 10th European Conference on Computer Vision, Marseille, France, October 12-18, 2008, Proceedings, Part II. Volume 5303 of Lecture Notes in Computer Science, pages 446-459, Springer, 2008. [doi]

Abstract

Abstract is missing.