Toggle-Masking for Test-per-Scan VLSI Circuits - researchr publication authors

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Nitin Parimi, Xiaoling Sun. Toggle-Masking for Test-per-Scan VLSI Circuits. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 332-338, IEEE Computer Society, 2004. [doi]

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