Jonathan Parion, Romain Scaffidi, Denis Flandre, Guy Brammertz, Bart Vermang. Low-temperature admittance spectroscopy for defect characterization in Cu(In,Ga)(S,Se)2 thin-film solar cells. In 20th IEEE International Conference on Smart Technologies, EUROCON 2023, Torino, Italy, July 6-8, 2023. pages 99-104, IEEE, 2023. [doi]
Abstract is missing.