Gang-Min Park, Hoon Chang. An extended march test algorithm for embedded memories. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 404-409, IEEE Computer Society, 1997. [doi]
@inproceedings{ParkC97:0, title = {An extended march test algorithm for embedded memories}, author = {Gang-Min Park and Hoon Chang}, year = {1997}, url = {http://csdl.computer.org/comp/proceedings/ats/1997/8209/00/82090404abs.htm}, tags = {testing}, researchr = {https://researchr.org/publication/ParkC97%3A0}, cites = {0}, citedby = {0}, pages = {404-409}, booktitle = {6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan}, publisher = {IEEE Computer Society}, isbn = {0-8186-8209-4}, }