Jinhyung Park, Yi-Chun Chen, Yu-Jhe Li, Kris Kitani. Crack Detection and Refinement Via Deep Reinforcement Learning. In 2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021. pages 529-533, IEEE, 2021. [doi]
@inproceedings{ParkCLK21,
title = {Crack Detection and Refinement Via Deep Reinforcement Learning},
author = {Jinhyung Park and Yi-Chun Chen and Yu-Jhe Li and Kris Kitani},
year = {2021},
doi = {10.1109/ICIP42928.2021.9506446},
url = {https://doi.org/10.1109/ICIP42928.2021.9506446},
researchr = {https://researchr.org/publication/ParkCLK21},
cites = {0},
citedby = {0},
pages = {529-533},
booktitle = {2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021},
publisher = {IEEE},
isbn = {978-1-6654-4115-5},
}