Jinhyung Park, Yi-Chun Chen, Yu-Jhe Li, Kris Kitani. Crack Detection and Refinement Via Deep Reinforcement Learning. In 2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021. pages 529-533, IEEE, 2021. [doi]
Abstract is missing.