Jaewoo Park, Jacky Chen Long Chai, Jaeho Yoon, Andrew Beng Jin Teoh. Understanding the Feature Norm for Out-of-Distribution Detection. In IEEE/CVF International Conference on Computer Vision, ICCV 2023, Paris, France, October 1-6, 2023. pages 1557-1567, IEEE, 2023. [doi]
Abstract is missing.