Jeong-Joon Park, Aleksander Holynski, Steven M. Seitz. Seeing the World in a Bag of Chips. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2020, Seattle, WA, USA, June 13-19, 2020. pages 1414-1424, IEEE, 2020. [doi]
Abstract is missing.