Wonhui Park, Dongkwon Jin, Chang-Su Kim 0001. Eigencontours: Novel Contour Descriptors Based on Low-Rank Approximation. In IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2022, New Orleans, LA, USA, June 18-24, 2022. pages 2657-2665, IEEE, 2022. [doi]
Abstract is missing.