Off-state degradation with ac bias in PMOSFET - researchr publication authors

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Segeun Park, Hyuckchai Jung, Jeonghoon Oh, Ilgweon Kim, Hyoungsun Hong, Gyoyoung Jin, Yonghan Roh. Off-state degradation with ac bias in PMOSFET. Microelectronics Reliability, 65:16-19, 2016. [doi]

This author has not been identified. Look up 'Segeun Park' in GoogleThis author has not been identified. Look up 'Hyuckchai Jung' in GoogleThis author has not been identified. Look up 'Jeonghoon Oh' in GoogleThis author has not been identified. Look up 'Ilgweon Kim' in GoogleThis author has not been identified. Look up 'Hyoungsun Hong' in GoogleThis author has not been identified. Look up 'Gyoyoung Jin' in GoogleThis author has not been identified. Look up 'Yonghan Roh' in Google

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