An Empirical Model for the Threshold Voltage of Enhancement NMOSFET s

Hong June Park, Choong-Ki Kim. An Empirical Model for the Threshold Voltage of Enhancement NMOSFET s. IEEE Trans. on CAD of Integrated Circuits and Systems, 4(4):629-635, 1985. [doi]

@article{ParkK85,
  title = {An Empirical Model for the Threshold Voltage of Enhancement NMOSFET s},
  author = {Hong June Park and Choong-Ki Kim},
  year = {1985},
  url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=28434&arnumber=1270163&count=37&index=30},
  tags = {empirical},
  researchr = {https://researchr.org/publication/ParkK85},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
  volume = {4},
  number = {4},
  pages = {629-635},
}