Jiheon Park, Daeyun Kim, Hoyong Lee, Seung-chul Shin, Myoungoh Ki, Bumsik Chung, Myunghan Bae, Myeonggyun Kye, Jonghan Ahn, Inho Song, Sunhwa Lee, Jaeil An, Il-Pyeong Hwang, Taemin An, Young-Gu Jin, Youngchan Kim, Youngsun Oh, Juhyun Ko, Haechang Lee, JoonSeo Yim. An Indirect Time-of-Flight CMOS Image Sensor Achieving Sub-ms Motion Lagging and 60fps Depth Image from On-chip ISP. In 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023. pages 1-2, IEEE, 2023. [doi]
@inproceedings{ParkKLSKCBKASLA23,
title = {An Indirect Time-of-Flight CMOS Image Sensor Achieving Sub-ms Motion Lagging and 60fps Depth Image from On-chip ISP},
author = {Jiheon Park and Daeyun Kim and Hoyong Lee and Seung-chul Shin and Myoungoh Ki and Bumsik Chung and Myunghan Bae and Myeonggyun Kye and Jonghan Ahn and Inho Song and Sunhwa Lee and Jaeil An and Il-Pyeong Hwang and Taemin An and Young-Gu Jin and Youngchan Kim and Youngsun Oh and Juhyun Ko and Haechang Lee and JoonSeo Yim},
year = {2023},
doi = {10.23919/VLSITechnologyandCir57934.2023.10185418},
url = {https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185418},
researchr = {https://researchr.org/publication/ParkKLSKCBKASLA23},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Kyoto, Japan, June 11-16, 2023},
publisher = {IEEE},
isbn = {978-4-86348-806-9},
}