Jinhee Park, Hyeon Jeong Kim, Ju-Hwan Shin, Jongmoon Baik. An Embedded Software Reliability Model with Consideration of Hardware Related Software Failures. In Sixth International Conference on Software Security and Reliability, SERE 2012, Gaithersburg, Maryland, USA, 20-22 June 2012. pages 207-214, IEEE, 2012. [doi]
Abstract is missing.