Hee Pyung Park, Sang-Woo Kim, Joong-Won Shin, Won-Ju Cho, Jong-Tae Park. Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors. Microelectronics Reliability, 88:873-877, 2018. [doi]
@article{ParkKSCP18,
title = {Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors},
author = {Hee Pyung Park and Sang-Woo Kim and Joong-Won Shin and Won-Ju Cho and Jong-Tae Park},
year = {2018},
doi = {10.1016/j.microrel.2018.06.052},
url = {https://doi.org/10.1016/j.microrel.2018.06.052},
researchr = {https://researchr.org/publication/ParkKSCP18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {873-877},
}