Eun-Mi Park, Jee-Hyong Lee. Classifying imbalanced data using an Svm ensemble with k-means clustering in semiconductor test process. In Branislav Vuksanovic, Jianhong Zhou, Antanas Verikas, editors, Sixth International Conference on Machine Vision, ICMV 2013, London, United Kingdom, April 16-17, 2013. Volume 9067 of SPIE Proceedings, SPIE, 2013. [doi]
Abstract is missing.